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Ab initioanalysis of a vacancy and a self-interstitial near single crystal silicon surfaces: Implications for intrinsic point defect incorporation during crystal growth from a melt

✍ Scribed by Kamiyama, Eiji ;Sueoka, Koji ;Vanhellemont, Jan


Book ID
112181023
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
343 KB
Volume
209
Category
Article
ISSN
0031-8965

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