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Intrinsic point defects and grown-in microdefects in silicon crystals—comment on: “Intrinsic point defect behaviour in silicon crystals during growth from the melt: A model derived from experimental results”, T. Abe, T. Takahashi, Journal of Crystal Growth 334 (2011) 16

✍ Scribed by V.V. Voronkov; R. Falster


Book ID
116630321
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
143 KB
Volume
351
Category
Article
ISSN
0022-0248

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