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Properties of ultra-thin wafer-bonded silicon-on-insulator MOSFET's

✍ Scribed by Mazhari, B.; Cristoloveanu, S.; Ioannou, D.E.; Caviglia, A.L.


Book ID
114537954
Publisher
IEEE
Year
1991
Tongue
English
Weight
729 KB
Volume
38
Category
Article
ISSN
0018-9383

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Interface coupling effects in thin silic
✍ T. Ouisse; S. Cristoloveanu; T. Elewa; B. Boukriss; A. Chovet πŸ“‚ Article πŸ“… 1990 πŸ› Elsevier Science 🌐 English βš– 526 KB

Several experiments converge to demonstrate the strong variation of the front channel properties with the substrate bias in thin film SOI-MOS structures. A model is proposed 'to explain the deformation of the transconductance shape and the variation of its maximum. A related second order effect cons