Properties of the CdTe/InSb interface studied by optical and surface analytical techniques

✍ Scribed by Feng, Z. C. ;Hung, S. Y. ;Wee, A. T. S.

• Book ID: 105363665
• Publisher: John Wiley and Sons
• Year: 2006
• Tongue: English
• Weight: 216 KB
• Volume: 203
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.200566013

✦ Synopsis

Abstract

Indium interdiffusion in MBE‐grown CdTe/InSb heterostructures was studied by optical and surface techniques of photoluminescence (PL), X‐ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS). A correlation between the two types of investigations is established. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)