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Thermal properties of the Sn/SiO2 interface as studied by surface spectroscopies

✍ Scribed by P.J. Chen; M.L. Colaianni; J.T. Yates Jr.; M. Arbab


Book ID
115989438
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
798 KB
Volume
155
Category
Article
ISSN
0022-3093

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