✦ LIBER ✦

Statistical properties of atomic-scale Si/SiO2 interface roughness studied by STM

✍ Scribed by M. Niwa; H. Iwasaki; Y. Watanabe; I. Sumita; N. Akutsu; Y. Akutsu

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Dependence of interface state density on

✍ PeterO. Hahn; S. Yokohama; M. Henzler 📂 Article 📅 1984 🏛 Elsevier Science ⚖ 51 KB

Ellipsometric study of Si surface roughn

✍ A Aizenberg; AV Andrianov; SV Nosenko; VI Pshenicin; IA Hromcovski 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 125 KB

Characterization of the metal-SiO2-Si in

✍ J. Suñé; Y. Placencia; F. Campabadal; X. Aymerich 📂 Article 📅 1987 🏛 Elsevier Science ⚖ 48 KB

Experimental study of electrical propert

✍ T.J. Zhang 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 373 KB

Recovery of the Si–SiO2 interface studie

✍ H. Karl; Ch. Delpero; P. Huber; B. Stritzker 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 126 KB

Atomic-scale characterization and contro

✍ M Tanaka; T Noda; H Sakaki 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 888 KB