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Properties of CeOx/La2O3 gate dielectric and its effects on the MOS transistor characteristics

✍ Scribed by H. Wong; B.L. Yang; K. Kakushima; P. Ahmet; H. Iwai


Book ID
113940913
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
685 KB
Volume
86
Category
Article
ISSN
0042-207X

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