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Effects of the interfacial layer on electrical characteristics of Al2O3/TiO2/Al2O3 thin films for gate dielectrics

✍ Scribed by Chang Eun Kim; Ilgu Yun

Book ID
116244843
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
750 KB
Volume
258
Category
Article
ISSN
0169-4332

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