𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Process-parameter variability in the manufacture of m.o.s. integrated circuits

✍ Scribed by Reynolds, F.H.; Stevens, J.W.


Book ID
119747885
Publisher
Institution of Electrical Engineers
Year
1977
Weight
498 KB
Volume
124
Category
Article
ISSN
0020-3270

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Process-induced defects in manufacture o
✍ R.K. Purohit; G.C. Dubey; S. Dayal; R. Gulati; V.R. Balakrishnan; Koteshwar Rao; πŸ“‚ Article πŸ“… 1994 πŸ› Elsevier Science 🌐 English βš– 304 KB

Semi-insulating liquid-incapsulated Czochralski GaAs wafers are generally used as substrates for the fabrication of monolithic microwave integrated circuits. In the fabrication process, the wafer is subjected to temperature cycling during the various stages of processing, namely post-ion implantatio

Intensity type state variables in the in
✍ Tibor TΓ³th; Ferenc ErdΓ©lyi; Farzad Rayegani πŸ“‚ Article πŸ“… 1999 πŸ› Elsevier Science 🌐 English βš– 287 KB

Nowadays rapid changes of market conditions require more efficient integration of Process Planning and Production Controlling in manufacturing industry. In computer integrated systems the classical models of manufacturing operation planning are not adequate for flexible operation management. This pa