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Erratum: Use of tests at elevated temperatures to accelerate the life of an m.o.s. integrated circuit

✍ Scribed by Reynolds, F.H.; Parrott, R.W.; Braithwaite, D.

Book ID: 119746652
Publisher: Institution of Electrical Engineers
Year: 1972
Weight: 168 KB
Volume: 119
Category: Article
ISSN: 0020-3270
DOI: 10.1049/piee.1972.0336

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Use of tests at elevated temperatures to

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