✦ LIBER ✦
Use of tests at elevated temperatures to accelerate the life of a MOS integrated circuit : F. H. Reynolds, R. W. Parrott and D. Braithwaite. Proc. IEE118, Nos. 3/4, March–April (1971), p. 475
- Publisher
- Elsevier Science
- Year
- 1972
- Tongue
- English
- Weight
- 109 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0026-2714
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