𝔖 Bobbio Scriptorium

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The response of the threshold voltages of the transistors in simple MOS circuits to tests at elevated temperatures : F. H. Reynolds, Proc. IEEE Reliab. Phys. Symp., Las Vegas, U.S.A. 31 March–2 April (1971)

Publisher: Elsevier Science
Year: 1971
Tongue: English
Weight: 104 KB
Volume: 10
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(71)90142-9

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Durability and stability of various insulating films against the high temperature water in an autoclave : J. Sato, Y. Ban and K. Maeda. Proc. IEEE Reliab. Phys. Symp., Las Vegas, U.S.A., 31 March–2 April (1971)

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Evaluation of the mechanical integrity of beam lead devices and bonds using thermomechanical stress waves : J. R. Adams and H. L. Floyd, Proc. IEEE Reliab. Phys. Symp., Las Vegas, U.S.A. 31 March–2 April (1971)

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