Probing electrical properties of oriented DNA by conducting atomic force microscopy
β Scribed by Cai, Lintao; Tabata, Hitoshi; Kawai, Tomoji
- Book ID
- 120268961
- Publisher
- Institute of Physics
- Year
- 2001
- Tongue
- English
- Weight
- 298 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0957-4484
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
## Abstract In this study, conducting atomic force microscopy was employed to investigate the nanoscale surface electrical properties of zinc oxide (ZnO) films prepared by pulsed laser deposition (PLD) at different substrate temperatures for use as anode materials in polymer lightβemitting diodes.
## Ε½ . Ε½ . We have demonstrated the characterizations of the local electrical properties of ultrathin 1-4 nm SiO rSi 001 2 Ε½ y5 . structures using a conducting atomic force microscopy with a nanometer-scale resolution in a vacuum 1 = 10 Pa . The measurement in a vacuum enables to reduce the influe