Electrical conductivities of nanosheets studied by conductive atomic force microscopy
β Scribed by Neval Yilmaz; Shintaro Ida; Yasumichi Matsumoto
- Book ID
- 113783150
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 270 KB
- Volume
- 116
- Category
- Article
- ISSN
- 0254-0584
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π SIMILAR VOLUMES
## Ε½ . Ε½ . We have demonstrated the characterizations of the local electrical properties of ultrathin 1-4 nm SiO rSi 001 2 Ε½ y5 . structures using a conducting atomic force microscopy with a nanometer-scale resolution in a vacuum 1 = 10 Pa . The measurement in a vacuum enables to reduce the influe
## Abstract In this study, conducting atomic force microscopy was employed to investigate the nanoscale surface electrical properties of zinc oxide (ZnO) films prepared by pulsed laser deposition (PLD) at different substrate temperatures for use as anode materials in polymer lightβemitting diodes.