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Studying the high-field electron conduction of tetrahedral amorphous carbon thin films by conducting atomic force microscopy

✍ Scribed by E.Z Luo; S Lin; Z Xie; J.B Xu; I.H Wilson; Y.H Yu; L.J Yu; X Wang

Book ID: 114340791
Publisher: Elsevier Science
Year: 2002
Tongue: English
Weight: 227 KB
Volume: 48
Category: Article
ISSN: 1044-5803
DOI: 10.1016/s1044-5803(02)00240-1

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