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Conductive-atomic force microscopy study of local electron transport in nanostructured titanium nitride thin films

✍ Scribed by K. Vasu; M. Ghanashyam Krishna; K.A. Padmanabhan

Book ID: 113937065
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 871 KB
Volume: 519
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2011.05.052

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