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Imaging the local electrical properties of metal surfaces by atomic force microscopy with conducting probes

✍ Scribed by Houzé, F.; Meyer, R.; Schneegans, O.; Boyer, L.


Book ID
119964897
Publisher
American Institute of Physics
Year
1996
Tongue
English
Weight
448 KB
Volume
69
Category
Article
ISSN
0003-6951

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Nanoscale surface electrical properties
✍ Chang-Feng Yu; Sy-Hann Chen; Wen-Jia Xie; Yung-Shao Lin; Cheng-Yu Shen; Sheng-Jh 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 238 KB

## Abstract In this study, conducting atomic force microscopy was employed to investigate the nanoscale surface electrical properties of zinc oxide (ZnO) films prepared by pulsed laser deposition (PLD) at different substrate temperatures for use as anode materials in polymer light‐emitting diodes.