Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

✍ Scribed by Houzé, F.; Alvarez, J.; Kleider, J.-P.; Bergonzo, P.; Snidero, E.; Tromson, D.

• Book ID: 122905156
• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 363 KB
• Volume: 15
• Category: Article
• ISSN: 0925-9635
• DOI: 10.1016/j.diamond.2005.11.052