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Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system

✍ Scribed by Langford, R. M.; Huang, Y. Z.; Lozano-Perez, S.; Titchmarsh, J. M.; Petford-Long, A. K.

Book ID: 126823590
Publisher: AVS (American Vacuum Society)
Year: 2001
Tongue: English
Weight: 594 KB
Volume: 19
Category: Article
ISSN: 0734-211X
DOI: 10.1116/1.1371317

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