𝔖 Bobbio Scriptorium
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Novel scheme for the preparation of transmission electron microscopy specimens with a focused ion beam

✍ Scribed by Overwijk, M. H. F.


Book ID
126183213
Publisher
AVS (American Vacuum Society)
Year
1993
Tongue
English
Weight
740 KB
Volume
11
Category
Article
ISSN
0734-211X

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## Abstract The surface properties of materials are believed to control most of the biological reactions toward implanted materials. To study the surface structure, elemental distribution, and morphology, using transmission electron microscopy (TEM) techniques, thin foils of the surface (in cross‐s