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Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique

✍ Scribed by Choi, P.-P.; Kwon, Y.-S.; Kim, J.-S.; Al-Kassab, T.


Book ID
121709223
Publisher
Oxford University Press
Year
2007
Tongue
English
Weight
944 KB
Volume
56
Category
Article
ISSN
0022-0744

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