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Focused ion beam milling: A practical method for preparing cast Al-Si alloy samples for transmission electron microscopy

✍ Scribed by S. Shankar; Y. W. Riddle; M. M. Makhlouf

Book ID: 107440319
Publisher: The Minerals, Metals & Materials Society
Year: 2003
Tongue: English
Weight: 799 KB
Volume: 34
Category: Article
ISSN: 1073-5623
DOI: 10.1007/s11661-003-0105-1

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