EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 724 || Transmission Electron Microscopy studies of bio-implant interfaces using Focused Ion Beam microscopy for sample preparation

✍ Scribed by Richter, Silvia; Schwedt, Alexander

• Book ID: 111688815
• Publisher: Springer Berlin Heidelberg
• Year: 2008
• Tongue: German
• Weight: 484 KB
• Category: Article
• ISBN: 3540852263
• DOI: 10.1007/978-3-540-85226-1_371

✦ Synopsis

Proceedings Of The14th European Microscopy Congress, Held In Aachen, Germany, 1-5 September 2008. Jointly Organised By The European Microscopy Society (ems), The German Society For Electron Microscopy (dge) And The Local Microscopists From Rwth Aachen University And The Research Centre Jülich, The Congress Brings Together Scientists From Europe And From All Over The World. The Scientific Programme Covers All Recent Developments In The Three Major Areas Of Instrumentation And Methods, Materials Science And Life Science.