𝔖 Bobbio Scriptorium
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Preparation of plant material for microautoradiography and electron-probe-microanalysis: The xylene technique

✍ Scribed by A. Ramati; Nili Liphschitz

Book ID
112732857
Publisher
Springer
Year
1975
Tongue
English
Weight
353 KB
Volume
31
Category
Article
ISSN
1420-682X

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An analytical expression for the characteristic line intensity of the x-rays emitted by a probe when bombarded by an electron beam is obtained using the Pontriaguin method. This method is applied to a simple model which is brieΓ‘y described.