Application of Electron Probe Microanalysis and Electron Microscopy to the Transfer of Antigenic Material
β Scribed by CLARKE, J. A.; SALSBURY, A. J.; WILLOUGHBY, D. A.
- Book ID
- 109673839
- Publisher
- Nature Publishing Group
- Year
- 1970
- Tongue
- English
- Weight
- 387 KB
- Volume
- 227
- Category
- Article
- ISSN
- 0028-0836
- DOI
- 10.1038/227069a0
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π SIMILAR VOLUMES
In the present paper the basic features of Monte Carlo method as applied to the electron probe microanalysis are outlined. In particular, applications to a large variety of experimental situations are reviewed. The problems examined are as follow: i) a binary film on a substrate of a third element;
## Abstract The aim of this work was development of electron probe microanalysis (EPMA) technique suitable for composition determination of nanoscale layers. Proposed technique allows to determine the content of thin layers lying beneath the surface including single quantum wells (SQWs). The method
An analytical expression for the characteristic line intensity of the x-rays emitted by a probe when bombarded by an electron beam is obtained using the Pontriaguin method. This method is applied to a simple model which is brieΓy described.