Boron thin 5lms were deposited by electron beam evaporation and by pyrolysis of decaborane on quartz substrates. Re6ection electron beam di4raction was used to characterize the crystal structure. The amorphous structure was observed for the 5lm deposited by electron beam evaporation. The 5lm was pol
Preparation and Properties of Boron Thin Films
β Scribed by Kiichi Kamimura; Miyako Ohkubo; Toshio Shinomiya; Masato Nakao; Yoshiharu Onuma
- Publisher
- Elsevier Science
- Year
- 1997
- Tongue
- English
- Weight
- 266 KB
- Volume
- 133
- Category
- Article
- ISSN
- 0022-4596
No coin nor oath required. For personal study only.
β¦ Synopsis
Boron thin films were prepared by plasma assisted chemical vapor deposition. The source gas was boron trichloride (BCl 3 ). Ring patterns of transmission electron beam diffraction indicated that films were polycrystalline -rhombohedral boron. Optical absorption edge was estimated from absorption spectrum. The absorption edge was about 1.05 eV for the films deposited at 700°°C and was increased to about 1.4 eV as the deposition temperature increased to higher than 800°°C. The Hall mobility was 10 Ψ4 -10 Ψ1 cm 2 /Vs and the carrier concentration was 10 16 -10 18 cm Ψ3 . All films showed p-type conduction. The piezoresistive gauge factor was about 10.
π SIMILAR VOLUMES
Boron+silicon amorphous 5lms were prepared by pulsed laser deposition technique. Band gap was estimated from the optical absorption spectrum for the 5lms, and it increased with increasing silicon concentration. The values and concentration dependence of the band gap are nearly the same as those meas
Amorphous boron and boron phosphide 5lms were prepared on silica glass by a solid source molecular beam deposition (SSMBD) method and a low-pressure chemical vapor deposition method (LPCVD) by adapting gas source molecular beam deposition at a reactant pressure of 1.33 Pa. The 5lms were characterize