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Preparation and characterization of ZrF4-BaF2-EuF3 planar glass films by electron cyclotron resonance plasma-enhanced chemical vapor deposition

✍ Scribed by Y. KAWAMOTO; R. KANNO; A. KONISHI

Book ID: 111534461
Publisher: Springer
Year: 1998
Tongue: English
Weight: 171 KB
Volume: 33
Category: Article
ISSN: 0022-2461
DOI: 10.1023/a:1004416215636

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