Preparation and characterization of BiFeO3/LaNiO3 heterostructure films grown on silicon substrate
β Scribed by Y.W. Li; Y.D. Shen; F.Y. Yue; Z.G. Hu; X.M. Ma; J.H. Chu
- Book ID
- 108166011
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 342 KB
- Volume
- 312
- Category
- Article
- ISSN
- 0022-0248
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
The effects of Ce substitution on the structural and electrical properties of multiferroic BiFeO 3 thin films grown on LaNiO 3 /Si(1 0 0) substrates by a sol-gel process have been reported. X-ray diffraction data confirmed the substitutions of Ce into the Bi site with the elimination of all secondar
## Abstract BaTiO~3~ (BTO) thin films of 100βnm were grown on Si substrates buffered with LaNiO~3~ (LNO) layers with various thicknesses. Xβray diffraction and strain analysis demonstrate that the BTO film grown on the LNO of 600βnm is in an inβplane compressive strain state. The remnant polarizati