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Characterization of Sn-doped BST thin films on LaNiO3–coated Si substrate

✍ Scribed by Wencheng Hu; Chuanren Yang; Xiaobo Liu; Wei He; Xianzhong Tang


Book ID
106397627
Publisher
Springer US
Year
2007
Tongue
English
Weight
327 KB
Volume
19
Category
Article
ISSN
0957-4522

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## Abstract BaTiO~3~ (BTO) thin films of 100 nm were grown on Si substrates buffered with LaNiO~3~ (LNO) layers with various thicknesses. X‐ray diffraction and strain analysis demonstrate that the BTO film grown on the LNO of 600 nm is in an in‐plane compressive strain state. The remnant polarizati