Ge nanocrystals (NCs) grown by ion implantation in amorphous silica matrices were irradiated with 5 MeV Si ions over a different fluence range (2 Γ 10 11 -2 Γ 10 13 cm Γ2 ) than previously reported. Size and depth distributions as well as structural disorder in the NCs were measured by RBS, TEM, SAX
Preferential amorphisation of Ge nanocrystals in a silica matrix
β Scribed by M.C. Ridgway; G. de M. Azevedo; R.G. Elliman; W. Wesch; C.J. Glover; R. Miller; D.J. Llewellyn; G.J. Foran; J.L. Hansen; A. Nylandsted Larsen
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 207 KB
- Volume
- 242
- Category
- Article
- ISSN
- 0168-583X
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β¦ Synopsis
Extended X-ray absorption fine structure and Raman spectroscopies have been used to compare the crystalline-to-amorphous phase transformation in nanocrystalline and polycrystalline Ge. We demonstrate Ge nanocrystals are extremely sensitive to ion irradiation and are rendered amorphous at an ion dose $40 times less than that required to amorphise bulk, crystalline standards. This rapid amorphisation is attributed to the higher-energy nanocrystalline structural state prior to irradiation, inhibited Frenkel pair recombination when Ge interstitials are recoiled into the matrix and preferential nucleation of the amorphous phase at the nanocrystal/matrix interface.
π SIMILAR VOLUMES
Germanium nanocrystals immersed in amorphous SiO x matrix have been synthesized by r.f. co-sputter deposition of Ge and quartz with post-growth annealing at 600-900 Β°C. The structures of the Ge nanocrystals and SiO x matrix have been studied with x-ray diffraction, high-resolution transmission elect