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Yellow emission of GaN nanocrystals embedded in a silica xerogel matrix

✍ Scribed by M Nyk; J.M Jabłoński; W Stręk; J Misiewicz

Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
400 KB
Volume
26
Category
Article
ISSN
0925-3467

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Extended X-ray absorption fine structure and Raman spectroscopies have been used to compare the crystalline-to-amorphous phase transformation in nanocrystalline and polycrystalline Ge. We demonstrate Ge nanocrystals are extremely sensitive to ion irradiation and are rendered amorphous at an ion dose