Positron annihilation and ESR study of irradiation-induced defects in silica glass
β Scribed by M. Hasegawa; M. Tabata; M. Fujinami; Y. Ito; H. Sunaga; S. Okada; S. Yamaguchi
- Book ID
- 113287776
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 793 KB
- Volume
- 116
- Category
- Article
- ISSN
- 0168-583X
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## Abstract We use positron annihilation to study 2βMeV ^4^He^+^ irradiated and subsequently rapidβthermalβannealed InN grown by molecularβbeam epitaxy and GaN grown by metalβorganic chemicalβvapour deposition. The irradiation fluences were in the range 5βΓβ10^14^β2βΓβ10^16^βcm^β2^. In vacancies ar
Positron Annihilation Spectroscopy (PAS) performed with continuous and pulsed positron beams allows to characterize the size of the intrinsic nano-voids in silica glass, their in depth modification after ion implantation and their decoration by implanted ions. Three complementary PAS techniques, lif