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Polystyrene negative resist for high-resolution electron beam lithography

✍ Scribed by Siqi Ma; Celal Con; Mustafa Yavuz; Bo Cui


Book ID
115021147
Publisher
Springer-Verlag
Year
2011
Tongue
English
Weight
455 KB
Volume
6
Category
Article
ISSN
1931-7573

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Ultra-High-Resolution electron-beam lith
✍ Craighead, H. G. πŸ“‚ Article πŸ“… 1985 πŸ› Wiley (John Wiley & Sons) 🌐 English βš– 891 KB

A conventional TEWSTEM has been used for the fabrication of -10 nm-size structures by electron-beam lithography. The electron microscope provides a versatile tool for studying the lithographic process with control of the beam energy, current, and profile combined with the ability to image both the p