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Platinum thin films deposited on silicon oxide by focused ion beam: characterization and application

✍ Scribed by A. R. Vaz; M. M. da Silva; J. Leon; S. A. Moshkalev; J. W. Swart

Book ID: 106393826
Publisher: Springer
Year: 2008
Tongue: English
Weight: 280 KB
Volume: 43
Category: Article
ISSN: 0022-2461
DOI: 10.1007/s10853-007-2402-3

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