Polycrystalline zinc oxide thin films with thicknesses in the range 0.3 ~m-1 #m were deposited on silicon and alumina substrates by a spray chemical vapour deposition method. The film was characterized for crystallinity, resistivity and carrier concentration. A modified heterostructure Pd/ZnO(0.38 ~
β¦ LIBER β¦
Characterization of piezoelectric properties of zinc oxide thin films deposited on silicon for sensors applications
β Scribed by J.L. Deschanvres; P. Rey; G. Delabouglise; M. Labeau; J.C. Joubert; J.C. Peuzin
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 225 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0924-4247
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