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Deposition and characterization of zinc oxide thin films for hydrogen sensor devices

โœ Scribed by A. Dutta; T.K. Chaudhuri; S. Basu


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
376 KB
Volume
14
Category
Article
ISSN
0921-5107

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โœฆ Synopsis


Polycrystalline zinc oxide thin films with thicknesses in the range 0.3 ~m-1 #m were deposited on silicon and alumina substrates by a spray chemical vapour deposition method. The film was characterized for crystallinity, resistivity and carrier concentration. A modified heterostructure Pd/ZnO(0.38 ~m)/p-Si device was fabricated. The current-voltage characteristics of the device were studied both in the absence and in the presence of hydrogen gas.


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