๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Modified heterojunction based on zinc oxide thin film for hydrogen gas-sensor application

โœ Scribed by S. Basu; A. Dutta


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
473 KB
Volume
22
Category
Article
ISSN
0925-4005

No coin nor oath required. For personal study only.

โœฆ Synopsis


Device-quahty ZnO thm film IS deposlted by usmg an mdlgenously developed moddied CVD method and a Pd/ZnO/p-B heteropmctlon IS fabricated A study of the current-voltage characterlstlcs of the heterolunctlon m pure air and m air with different concentrations (2000-20 000 ppm) of hydrogen reveals that the device can be used as a room-temperature hydrogen sensor down to a level of hydrogen below Its explosron mucture mth an The saturatwn sensltlvlty and time response of the device wth respect to the dtierent hydrogen concentrattons m air has been studled The device operatmg at 1 V forward bias shows a maxLmum saturation sensltlvlty m different hydrogen concentrations At 20 000 ppm Hz m air, the sensltlvlty 1s found to be 5 x 102, while the time response IS 162 s The mcrease of surface ConductMly of ZnO at the Pd/ZnO Interface due to the adsorption and chemical mteractlon of hydrogen 1s found to play a key role m sensmg This mechamsm of hydrogen sensing 1s verdied by a double-metal-gate heterolunctlon


๐Ÿ“œ SIMILAR VOLUMES


Deposition and characterization of zinc
โœ A. Dutta; T.K. Chaudhuri; S. Basu ๐Ÿ“‚ Article ๐Ÿ“… 1992 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 376 KB

Polycrystalline zinc oxide thin films with thicknesses in the range 0.3 ~m-1 #m were deposited on silicon and alumina substrates by a spray chemical vapour deposition method. The film was characterized for crystallinity, resistivity and carrier concentration. A modified heterostructure Pd/ZnO(0.38 ~

A highly sensitive humidity sensor based
โœ Padmanathan Karthick Kannan; Ramiah Saraswathi; John Bosco Balaguru Rayappan ๐Ÿ“‚ Article ๐Ÿ“… 2010 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 844 KB

Nanostructured ZnO thin film was prepared by DC reactive magnetron sputtering and characterized by X-ray diffraction, SEM, AFM, FT-IR spectroscopy, UV-vis spectroscopy and photoluminescence measurements. Under the conditions employed, the sputtered ZnO film was found to be polycrystalline with grain