Films were produced by plasma enhanced chemical vapor deposition (PECVD) of tetramethylsilane (TMS) -helium-argon mixtures with either oxygen or nitrogen in a vacuum system fed with radiofrequency power. Actinometric optical emission spectroscopy was used to determine trends in the concentrations of
✦ LIBER ✦
Plasma Characterization of Oxygen-Tetramethylsilane Mixtures for the Plasma-Enhanced CVD of SiOxCyHz Thin Films
✍ Scribed by Á. Yanguas-Gil; Á. Barranco; J. Cotrino; P. Gröning; A. R. González-Elipe
- Publisher
- John Wiley and Sons
- Year
- 2006
- Tongue
- English
- Weight
- 362 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0948-1907
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## Abstract Plasma CVD is a candidate technology for the fabrication of optical polymer waveguides. It can deposit a film on any surface geometry and any substrate material at a temperature under 200 °C in a vacuum process. It also provides good thickness controllability and uniformity of the depos