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Plane stress fracture toughness of freestanding nanoscale thin films

✍ Scribed by H. Hosokawa; A.V. Desai; M.A. Haque

Book ID: 108290057
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 360 KB
Volume: 516
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2008.03.005

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