Fracture Toughness, Fracture Strength, and Stress Corrosion Cracking of Silicon Dioxide Thin Films
β Scribed by Hatty, V.; Kahn, H.; Heuer, A.H.
- Book ID
- 120426303
- Publisher
- IEEE
- Year
- 2008
- Tongue
- English
- Weight
- 534 KB
- Volume
- 17
- Category
- Article
- ISSN
- 1057-7157
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