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Physics-based single-piece charge model for strained-Si MOSFETs

โœ Scribed by Chandrasekaran, K.; Xing Zhou; Chiah, S.B.; Shangguan, W.; Guan Huei See


Book ID
114617844
Publisher
IEEE
Year
2005
Tongue
English
Weight
566 KB
Volume
52
Category
Article
ISSN
0018-9383

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