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Physico-Chemical Characterization of Sprayed ?-Ag2S Thin Films

✍ Scribed by Dlala, H. ;Amlouk, M. ;Ben Nasrallah, T. ;Bernede, J.C. ;Belgacem, S.


Publisher
John Wiley and Sons
Year
2000
Tongue
English
Weight
115 KB
Volume
181
Category
Article
ISSN
0031-8965

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✦ Synopsis


Silver sulfide Ag 2 S thin films have been prepared on pyrex and on SnO 2 /pyrex substrates by the spray pyrolysis technique (Dlala et al., Europ. Phys. J. A 2, 13 (1998)) using silver acetate and thiourea as precursors. The depositions were carried out at 200 and 250 C. The X-ray diffraction spectra show that a substrate temperature T s = 250 C with a concentration ratio x = [S]/[Ag] = 2 in the solution allows to obtain well crystallized thin films with a preferential orientation along ( 103) direction. Microprobe analysis as well as X-ray photoelectron spectroscopy (XPS) show that a nearly stoichiometric composition is obtained under these conditions. Moreover, we noticed by the same technique the presence of oxygen and carbon components particularly on the surface, due to a contamination effect. Indeed, it can be seen after etching that the intensity peaks decrease strongly, which indicated the weak proportion of these elements in the bulk of the films.

Des couches minces de sulfure d'argent Ag 2 S sont pre Γ‚ pare Γ‚ es, sur substrats de pyrex et de SnO 2 / pyrex par la technique de pulve Γ‚ risation chimique re Γ‚ active en phase liquide (Dlala et al., Europ. Phys. J. A 2, 13 (1998)) en utilisant comme pre Γ‚ curseurs l'ace Γ‚ tate d'argent et la thioure Γ‚ e. Les de Γ‚ po Γƒ ts ont e Γ‚ te Γ‚ fabrique Γ‚ s aux tempe Γ‚ ratures de substrat 200 et 250 C. Les diagrammes de diffraction de rayons X montrent que les couches de Ag 2 S, re Γ‚ alise Γ‚ es a Á une tempe Γ‚ rature de substrat de 250 C et avec un rapport de concentrations en solution x = [S]/[Ag] = 2, sont assez bien cristallise Γ‚ es et les cristallites sont oriente Γ‚ es pre Γ‚ fe Γ‚ rentiellement suivant la direction ( 103). L'analyse par microsonde e Γ‚ lectronique (EPMA) et par spectroscopie de photoe Γ‚ lectrons X (XPS), montre qu'une bonne stoichiome Γ‚ trie est obtenue pour ces conditions d'e Γ‚ laboration. De plus, d'apre Á s les spectres obtenus par XPS, nous remarquons la pre Γ‚ sence d'e Γ‚ le Γ‚ ments oxyge Á ne et carbone essentiellement en surface, du Γƒ a Á un effet de contamination. En effet, la me Γƒ me technique d'analyse montre qu'apre Á s de Γ‚ capage des de Γ‚ po Γƒ ts, l'intensite Γ‚ des raies correspondantes diminuent conside Γ‚ rablement indiquant leur faible proportion en volume.


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