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Physical noise modeling of SOI MOSFETs with analysis of the Lorentzian component in the low-frequency noise spectrum

โœ Scribed by Workman, G.O.; Fossum, J.G.


Book ID
114538178
Publisher
IEEE
Year
2000
Tongue
English
Weight
287 KB
Volume
47
Category
Article
ISSN
0018-9383

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