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Physical models for degradation effects in polysilicon thin-film transistors

✍ Scribed by Hack, M.; Lewis, A.G.; Wu, I.-W.

Book ID: 114535108
Publisher: IEEE
Year: 1993
Tongue: English
Weight: 828 KB
Volume: 40
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.210195

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