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Photoluminescence from SiO x thin films: effects of film thickness and annealing temperature

✍ Scribed by Fang, Y C; Li, W Q; Qi, L J; Li, L Y; Zhao, Y Y; Zhang, Z J; Lu, M

Book ID: 120387029
Publisher: Institute of Physics
Year: 2004
Tongue: English
Weight: 414 KB
Volume: 15
Category: Article
ISSN: 0957-4484
DOI: 10.1088/0957-4484/15/5/016

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