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Photoluminescence from RF sputtered SiCBN thin films

โœ Scribed by Arun Vijayakumar; Andrew P. Warren; Ravi M. Todi; Kalpathy B. Sundaram


Publisher
Springer US
Year
2008
Tongue
English
Weight
321 KB
Volume
20
Category
Article
ISSN
0957-4522

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Trap Levels in RF Sputtered CdS Thin Fil
โœ Ashour, H. ;El Akkad, F. ๐Ÿ“‚ Article ๐Ÿ“… 2001 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 70 KB ๐Ÿ‘ 2 views

The trap levels in CdS thin films prepared by rf magnetron sputtering have been investigated using Photoinduced Current Transient Spectroscopy (PICTS). Trap levels in the range 0.08-1.06 eV have been detected. Those levels are tentatively attributed to native defects and foreign impurities (particul