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Investigation of rf sputtered CrSiO thin resistor films

✍ Scribed by M Czermann; I Trifonov; G Katona; O Geszti; A Sulyok


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
107 KB
Volume
40
Category
Article
ISSN
0042-207X

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Trap Levels in RF Sputtered CdS Thin Fil
✍ Ashour, H. ;El Akkad, F. πŸ“‚ Article πŸ“… 2001 πŸ› John Wiley and Sons 🌐 English βš– 70 KB πŸ‘ 2 views

The trap levels in CdS thin films prepared by rf magnetron sputtering have been investigated using Photoinduced Current Transient Spectroscopy (PICTS). Trap levels in the range 0.08-1.06 eV have been detected. Those levels are tentatively attributed to native defects and foreign impurities (particul