๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Properties of RF-sputtered CdS thin films

โœ Scribed by F El Akkad; M Abdel Naby


Publisher
Elsevier Science
Year
1989
Weight
361 KB
Volume
18
Category
Article
ISSN
0165-1633

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Trap Levels in RF Sputtered CdS Thin Fil
โœ Ashour, H. ;El Akkad, F. ๐Ÿ“‚ Article ๐Ÿ“… 2001 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 70 KB ๐Ÿ‘ 2 views

The trap levels in CdS thin films prepared by rf magnetron sputtering have been investigated using Photoinduced Current Transient Spectroscopy (PICTS). Trap levels in the range 0.08-1.06 eV have been detected. Those levels are tentatively attributed to native defects and foreign impurities (particul