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Photoemission investigation of bulk-grown versus epitaxial thin film CoSi2(111) surfaces

✍ Scribed by C. Pirri; P. Wetzel; J.C. Peruchetti; D. Bolmont; G. Gewinner; K. Hricovini; J. Bonnet


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
327 KB
Volume
56-58
Category
Article
ISSN
0169-4332

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Laue oscillations) appear close to the high-angle reflections. The film thickness can then be evaluated as: where W i and W i-1 are positions of adjacent satellite maxima.