✦ LIBER ✦
X-ray diffraction evidence for the existence of epitaxial microcrystallites in thermally oxidized SiO2 thin films on Si(111) surfaces
✍ Scribed by T. Shimura; H. Misaki; M. Umeno; I. Takahashi; J. Harada
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 354 KB
- Volume
- 166
- Category
- Article
- ISSN
- 0022-0248
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